Failure Report

Failure Analysis Market Size, Share & Trends Analysis Report By Equipment (Optical Microscope, SEM, TEM, FIB, FIB-SEM, Scanning Probe Microscope), By Technology (EDX, SIMS, FIB, RIE, SPM), By Vertical, By Region, And Segment Forecasts, 2024 - 2030

  • Report ID: GVR-4-68040-357-2
  • Number of Report Pages: 120
  • Format: PDF
  • Historical Range: 2018 - 2023
  • Forecast Period: 2024 - 2030 
  • Industry: Technology

Market Segmentation

  • Failure Analysis Equipment Outlook (Revenue, USD Million, 2018 - 2030)
    • Optical Microscope
    • Scanning Electron Microscope (SEM)
    • Transmission Electron Microscope (TEM)
    • Scanning Probe Microscope
    • Focused Ion Beam System (FIB)
    • Dual-Beam System (FIB-SEM)
  • Failure Analysis Technology Outlook (Revenue, USD Million, 2018 - 2030)
    • Energy Dispersive X-Ray Spectroscopy (EDX)
    • Secondary Ion Mass Spectroscopy (SIMS)
    • Focused Ion Beam (FIB)
    • Broad Ion Miling (BIM)
    • Relative Ion Etching (RIE)
    • Scanning Probe Microscope (SPM)
  • Failure Analysis Vertical Outlook (Revenue, USD Million, 2018 - 2030)
    • Electronics & Semiconductor
    • Oil & Gas
    • Defense
    • Manufacturing
    • Construction
    • Others
  • Failure Analysis Regional Outlook (Revenue, USD Million, 2018 - 2030)
    • North America
      • North America Failure Analysis Market, by Equipment
        • Optical Microscope
        • Scanning Electron Microscope (SEM)
        • Transmission Electron Microscope (TEM)
        • Scanning Probe Microscope
        • Focused Ion Beam System (FIB)
        • Dual-Beam System (FIB-SEM)
      • North America Failure Analysis Market, by Technology
        • Energy Dispersive X-Ray Spectroscopy (EDX)
        • Secondary Ion Mass Spectroscopy (SIMS)
        • Focused Ion Beam (FIB)
        • Broad Ion Miling (BIM)
        • Relative Ion Etching (RIE)
        • Scanning Probe Microscope (SPM)
      • North America Failure Analysis Market, by Vertical
        • Electronics & Semiconductor
        • Oil & Gas
        • Defense
        • Manufacturing
        • Construction
        • Others
      • U.S.
        • U.S. Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • U.S. Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • U.S. Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
      • Canada
        • Canada Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • Canada Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • Canada Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
      • Mexico
        • Mexico Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • Mexico Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • Mexico Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
    • Europe
      • Europe Failure Analysis Market, by Equipment
        • Optical Microscope
        • Scanning Electron Microscope (SEM)
        • Transmission Electron Microscope (TEM)
        • Scanning Probe Microscope
        • Focused Ion Beam System (FIB)
        • Dual-Beam System (FIB-SEM)
      • Europe Failure Analysis Market, by Technology
        • Energy Dispersive X-Ray Spectroscopy (EDX)
        • Secondary Ion Mass Spectroscopy (SIMS)
        • Focused Ion Beam (FIB)
        • Broad Ion Miling (BIM)
        • Relative Ion Etching (RIE)
        • Scanning Probe Microscope (SPM)
      • Europe Failure Analysis Market, by Vertical
        • Electronics & Semiconductor
        • Oil & Gas
        • Defense
        • Manufacturing
        • Construction
        • Others
      • Germany
        • Germany Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • Germany Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • Germany Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
      • UK
        • UK Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • UK Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • UK Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
      • France
        • France Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • France Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • France Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
    • Asia Pacific
      • Asia Pacific Failure Analysis Market, by Equipment
        • Optical Microscope
        • Scanning Electron Microscope (SEM)
        • Transmission Electron Microscope (TEM)
        • Scanning Probe Microscope
        • Focused Ion Beam System (FIB)
        • Dual-Beam System (FIB-SEM)
      • Asia Pacific Failure Analysis Market, by Technology
        • Energy Dispersive X-Ray Spectroscopy (EDX)
        • Secondary Ion Mass Spectroscopy (SIMS)
        • Focused Ion Beam (FIB)
        • Broad Ion Miling (BIM)
        • Relative Ion Etching (RIE)
        • Scanning Probe Microscope (SPM)
      • Asia Pacific Failure Analysis Market, by Vertical
        • Electronics & Semiconductor
        • Oil & Gas
        • Defense
        • Manufacturing
        • Construction
        • Others
      • China
        • China Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • China Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • China Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
      • India
        • India Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • India Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • India Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
      • Japan
        • Japan Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • Japan Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • Japan Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
      • Australia
        • Australia Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • Australia Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • U.S. Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
      • South Korea
        • South Korea Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • South Korea Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • South Korea Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
    • Latin America
      • Latin America Failure Analysis Market, by Equipment
        • Optical Microscope
        • Scanning Electron Microscope (SEM)
        • Transmission Electron Microscope (TEM)
        • Scanning Probe Microscope
        • Focused Ion Beam System (FIB)
        • Dual-Beam System (FIB-SEM)
      • Latin America Failure Analysis Market, by Technology
        • Energy Dispersive X-Ray Spectroscopy (EDX)
        • Secondary Ion Mass Spectroscopy (SIMS)
        • Focused Ion Beam (FIB)
        • Broad Ion Miling (BIM)
        • Relative Ion Etching (RIE)
        • Scanning Probe Microscope (SPM)
      • Latin America Failure Analysis Market, by Vertical
        • Electronics & Semiconductor
        • Oil & Gas
        • Defense
        • Manufacturing
        • Construction
        • Others
      • Brazil
        • Brazil Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • Brazil Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • Brazil Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
    • Middle East & Africa
      • Middle East & Africa Failure Analysis Market, by Equipment
        • Optical Microscope
        • Scanning Electron Microscope (SEM)
        • Transmission Electron Microscope (TEM)
        • Scanning Probe Microscope
        • Focused Ion Beam System (FIB)
        • Dual-Beam System (FIB-SEM)
      • Middle East & Africa Failure Analysis Market, by Technology
        • Energy Dispersive X-Ray Spectroscopy (EDX)
        • Secondary Ion Mass Spectroscopy (SIMS)
        • Focused Ion Beam (FIB)
        • Broad Ion Miling (BIM)
        • Relative Ion Etching (RIE)
        • Scanning Probe Microscope (SPM)
      • Middle East & Africa Failure Analysis Market, by Vertical
        • Electronics & Semiconductor
        • Oil & Gas
        • Defense
        • Manufacturing
        • Construction
        • Others
      • UAE
        • UAE Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • UAE Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • UAE Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
      • Kingdom of Saudi Arabia
        • Kingdom of Saudi Arabia Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • Kingdom of Saudi Arabia Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • Kingdom of Saudi Arabia Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others
      • South Africa
        • South Africa Failure Analysis Market, by Equipment
          • Optical Microscope
          • Scanning Electron Microscope (SEM)
          • Transmission Electron Microscope (TEM)
          • Scanning Probe Microscope
          • Focused Ion Beam System (FIB)
          • Dual-Beam System (FIB-SEM)
        • South Africa Failure Analysis Market, by Technology
          • Energy Dispersive X-Ray Spectroscopy (EDX)
          • Secondary Ion Mass Spectroscopy (SIMS)
          • Focused Ion Beam (FIB)
          • Broad Ion Miling (BIM)
          • Relative Ion Etching (RIE)
          • Scanning Probe Microscope (SPM)
        • South Africa Failure Analysis Market, by Vertical
          • Electronics & Semiconductor
          • Oil & Gas
          • Defense
          • Manufacturing
          • Construction
          • Others

Report content

Qualitative Analysis

  • Industry overview
  • Industry trends
  • Market drivers and restraints
  • Market size
  • Growth prospects
  • Porter’s analysis
  • PESTEL analysis
  • Key market opportunities prioritized
  • Competitive landscape
    • Company overview
    • Financial performance
    • Product benchmarking
    • Latest strategic developments

Quantitative Analysis

  • Market size, estimates, and forecast from 2018 to 2030
  • Market estimates and forecast for product segments up to 2030
  • Regional market size and forecast for product segments up to 2030
  • Market estimates and forecast for application segments up to 2030
  • Regional market size and forecast for application segments up to 2030
  • Company financial performance
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